Abstract
High-crystallinity, direct-band-gap Ge0.89Sn0.11 is achieved at <450°C on amorphous dielectric layers and flexible substrates. The geometrically confined growth of pseudo-single-crystal Ge0.89Sn0.11 enables monolithic, large-scale 3D Si photonics.
© 2015 Optical Society of America
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Supplementary Material (1)