Abstract

We report the instrumentation of a near-infrared near-field scanning optical microscope (NSOM). This NSOM is applied for the characterization of a simple yet novel silicon micro-optic device.

© 2006 Optical Society of America

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription