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Direct Real-Time Determination of Compositional Profiles in Structured Materials Using Laser Ablation Instruments: LIBS and LA-ICP-MS

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Abstract

Laser ablation offers rapid micro-analysis with high spatial resolution about ~10 nm in depth and ~3 μm lateral. Structured materials can be mapped and depth-profiled for elemental and isotopic composition using LIBS or LA-ICP-MS without a need for sample preparation. Molecular structure of the sample can often be inferred by chemometric processing of the spectra.

© 2012 Optical Society of America

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