Abstract

The factors which affect resolution in diffraction microscopy are studied. The inequality pλ>4nd/N is a necessary condition for making good holograms, where p is the distance between source and film, d is the diameter of the source, and λ is its wavelength, n is the number of recorded central bands of the diffraction pattern, and N is the resolving power of the film. The minimum theoretical resolvable distance between two point objects is limited by d and N but not by the wavelengths used in the analysis and reconstruction. Possible applications to the focusing of x-rays by Gabor techniques and by a single Fresnel zone plate are considered.

© 1952 Optical Society of America

The Formation of the Diffraction Image with Electrons in the Gabor Diffraction Microscope

M. E. Haine and T. Mulvey
J. Opt. Soc. Am. 42(10) 763-773 (1952)

On the Theory of Diffraction by Concentric Arrays of Ring-Shaped Apertures

Albéric Boivin
J. Opt. Soc. Am. 42(1) 60-64 (1952)

An Experimental Study of Diffraction Showing the Boundary Effect

A. P. Thatte
J. Opt. Soc. Am. 42(3) 166-171 (1952)

X-Ray Spectroscopy as a Control Method in the Production of Zirconium and Hafnium

D. M. Mortimore and P. A. Romans
J. Opt. Soc. Am. 42(9) 673-677 (1952)

Image Reconstruction from a Fraunhofer X-Ray Hologram with Visible Light*

John W. Giles
J. Opt. Soc. Am. 59(9) 1179-1188 (1969)