Abstract

The potentiality of synchrotron infrared microspectrometry was investigated for in situ analysis of fluid inclusions and volatiles of particular geological interest. Thanks to the intrinsic high brightness of the synchrotron infrared source, areas as small as a few mu m2 can be probed, providing a high-contrast analysis of small inclusions in geological materials. We have identified organic components in such small volumes in their liquid and gaseous phase, thus allowing a deeper analysis of oil-water inclusions entrapped in diagenetic cements. Such detailed analysis opens up new perspectives in petroleum reservoir evolution studies. The high signal-to-noise ratio of spectra obtained in small volume allows a fast and accurate chemical mapping of the inclusion components. Drastic refraction effects preclude, at the present state, a quantitative analysis of either the volume or the thickness of the individual inclusions. Traces of volatiles such as CO2 and H2O are easily detected in the vitreous and gaseous part of the glass melt fluid inclusions. We have also profiled the hydroxyl concentration near a wall, and calculated the hydrogen diffusion coefficient in anhydrous minerals such as diopside.

Exploiting FTIR microspectroscopy and chemometric analysis in the discrimination between Egyptian ancient bones: a case study

A. El-Hussein, I. Yousef, and M. A. Kasem
J. Opt. Soc. Am. B 37(11) A110-A120 (2020)

In situ chemical analysis of geology samples by a rapid simultaneous ultraviolet/visible/near-infrared (UVN) + longwave-infrared laser induced breakdown spectroscopy detection system at standoff distance

Clayton S. C. Yang, Feng Jin, Sudhir Trivedi, Ei Brown, Uwe Hömmerich, Laszlo Nemes, and Alan C. Samuels
Opt. Express 27(14) 19596-19614 (2019)

Transformed world of industrial infrared analysis

Jeanette G. Grasselli and Lynn E. Wolfram
Appl. Opt. 17(9) 1386-1399 (1978)

Microscopic emission and reflectance thermal infrared spectroscopy: instrumentation for quantitative in situ mineralogy of complex planetary surfaces

C. S. Edwards and P. R. Christensen
Appl. Opt. 52(11) 2200-2217 (2013)

Synchrotron Radiation as an Infrared Source

James R. Stevenson, H. Ellis, and Roger Bartlett
Appl. Opt. 12(12) 2884-2889 (1973)