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Abstract
We measured the Mueller matrix bidirectional reflectance distribution function (BRDF) of a sintered polytetrafluoroethylene (PTFE) sample over the scattering hemisphere for six incident angles (0°–75° in 15° steps) and for four wavelengths (351 nm, 532 nm, 633 nm, and 1064 nm). The data for each wavelength were fit to a phenomenological description for the Mueller matrix BRDF, which is an extension of the bidirectional surface scattering modes developed by Koenderink and van Doorn [J. Opt. Soc. Am. A. 15, 2903 (1998) [CrossRef] ] for unpolarized BRDF. This description is designed to be complete, to obey the appropriate reciprocity conditions, and to provide a full description of the Mueller matrix BRDF as a function of incident and scattering directions for each wavelength. The description was further extended by linearizing the surface scattering mode coefficients with wavelength. This data set and its parameterization provides a comprehensive on-demand description of the reflectance properties for this commonly used diffuse reflectance reference material over a wide range of wavelengths.
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