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Self-referenced spectral interferometry for simultaneous measurements of thickness and refractive index

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Abstract

We present a method for simultaneously measuring the thickness and the group refractive index of a specimen using self-referenced spectral-domain fiber-based interferometry. By removing the scanning part and using the fiber-based configuration, the system complexity and stability could be significantly improved. To minimize the system drift, we utilized the signals originated from the fiber ends of both arms. Implementing in a self-referenced configuration, we could improve the measurement accuracy down to a decimal place. Experimental measurements were made with a 1.555mm thick fused silica plate. At 814nm the thickness was measured as 1.5546±0.0002mm, and at the same time, the group index was obtained as 1.4627±0.0002.

© 2009 Optical Society of America

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