Abstract
Herein, the method of spectrum-encoded dual-comb interferometry is introduced to measure a three-dimensional (3-D) profile with absolute distance information. By combining spectral encoding for wavelength-to-space mapping, dual-comb interferometry for decoding and optical reference for calibration, this system can obtain a 3-D profile of an object at a stand-off distance of 114 mm with a depth precision of 12 μm. With the help of the reference arm, the absolute distance, reflectivity distribution, and depth information are simultaneously measured at a 5 kHz line-scan rate with free-running carrier-envelope offset frequencies. To verify the concept, experiments are conducted with multiple objects, including a resolution test chart, a three-stair structure, and a designed “ECNU” letter chain. The results show a horizontal resolution of and a measurement range of 1.93 mm.
© 2018 Optical Society of America
Full Article | PDF ArticleMore Like This
Wanping Lu, Zhiwei Zhu, Benjamin Willenberg, Justinas Pupeikis, Christopher R. Phillips, Ursula Keller, and Shih-chi Chen
Opt. Lett. 49(7) 1766-1769 (2024)
David R. Carlson, Daniel D. Hickstein, Daniel C. Cole, Scott A. Diddams, and Scott B. Papp
Opt. Lett. 43(15) 3614-3617 (2018)
Camille Scotté, Siddharth Sivankutty, Randy A. Bartels, and Hervé Rigneault
Opt. Lett. 45(19) 5567-5570 (2020)