Joint Feature Issue of Optical Materials Express and Optics Express
Nonlinear Optics 2017
Submission Opens:1 September 2017
Submission Deadline: 1 October 2017
Following up on successful feature issues in 2011, 2013, and 2015, the OSA journals Optics Express and Optical Materials Express will be teaming up to publish a joint feature issue in connection with the Nonlinear Optics 2017 Conference (17-21 July 2017). Although meeting participants are particularly encouraged to submit their work, all are welcome to submit a paper on a related topic.
All papers need to present original, previously unpublished work, and will be subject to the normal standards and peer-review process of the journals. The standard Optics Express or Optical Materials Express publication charges will apply to all published articles. To be eligible for publication, the paper needs to add substantial and/or significant new information to the original conference summary. Please see OSA's guidelines on expanded conference papers here.
Authors may choose to submit to either Optics Express or Optical Materials Express, but generally, we encourage submitting materials-oriented papers to Optical Materials Express, while all other topics from the NLO conference would be better suited for Optics Express.
Papers will appear in their respective journals and will be published online upon acceptance. Additionally, a joint virtual feature issue with a combined table of contents of papers in both journals will appear when all papers are published. Manuscripts must be prepared according to the usual standards for submission to Optics Express and Optical Materials Express and must be uploaded through OSA's electronic submission system, specifying from the drop-down menu that the manuscript is for the Nonlinear Optics 2017 feature issue.
Feature Editors
Optical Materials Express Editors:
David Hagan, University of Central Florida, CREOL, USA (Lead Editor)
Ivan Biaggio, Lehigh University, USA
Optics Express Editors:
Cornelia Denz, University of Muenster, Germany (Lead Editor)
Mansoor Sheik-Bahae, University of New Mexico, USA
Haim Suchowski, Tel Aviv University, Israel