The error in the description of the design consideration for the OMNI-sine method is corrected [1]. The notation of the bin width of |tan θ| [pixels] corresponding to the sampling interval of each column in Fig. 4(a) (Fig. 1 in this erratum) is corrected to be |sin θ| [pixels]. The diagram and caption for Fig. 4 should be corrected as follows.

 

Fig. 1. Geometric diagram of binning using the OMNI-sine method: (a) (cos θ)-pixel-wide and |sin θ|-pixel-wide intervals to maintain the pixel interval in each row and column, respectively, and (b, c) (sin θ)-pixel-wide bin intervals for tan θ = 1/4 and tan θ = 1/3, respectively. Refer to Fig. 2 for details on the graphics.

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The corresponding description in the fifth and sixth sentences of the first paragraph of Section 4 is also corrected as follows:

The sampling interval of each column of the ROI, on the other hand, aligns with the bin array at intervals of |sin θ| pixels, where the bin array is simultaneously aligned with the projection paths of the pixels of each row and column for some critical angles.

I have confirmed that this error is isolated and no other problems exist with the proposed method and simulation results.