Abstract
We investigated the effects of non-lasing bands on the beam patterns in photonic-crystal lasers by evaluating the omnidirectional band structure both experimentally and theoretically. We found that a new, weak dual-streak pattern is occasionally generated around the main lobe of the output beam because of scattering of the lasing beam in the non-lasing bands despite a wavenumber mismatch. This result indicates that we can design the high-quality devices without such a noise pattern. In addition, this evaluation method is expected to be useful for developing various high-functionality PC lasers.
©2012 Optical Society of America
1. Introduction
Two-dimensional (2D) photonic-crystal (PC) lasers [1–17] have recently attracted considerable attention for their potential as high-quality and functional semiconductor lasers. This is because they utilize a 2D PC as a resonator to realize 2D broad-area single-mode oscillation by Bragg reflection and thus a very narrow (<1°) divergence angle [9–11, 16]. In addition, by appropriately designing the PC structure [8, 10, 12, 13, 15, 16], their polarization [3, 7, 10, 12], beam pattern [10, 12, 16], and even beam direction [14, 17] can be controlled. The resonant characteristics of 2D PC lasers are determined by the photonic band structure [18, 19], namely, the dispersion relation between the wavevector and the frequency of light inside the PC. Generally, lasing oscillation occurs at any one of the band edges at highly symmetric points; therefore, the band structure is normally evaluated in highly symmetrical directions.
Here, we report that a very weak dual-streak pattern (around the strong main peak) is occasionally (depending on the PC design) observed and is not along these special directions. This newly discovered phenomenon cannot be explained by the normal evaluation of the band structure. In this study, we evaluated the omnidirectional band structures both experimentally and theoretically and clarified that non-lasing bands may contribute to the generation of this unusual beam pattern. In Section 2, we explain the evaluation methods together with the device structure, procedures for beam-pattern and omnidirectional band-structure measurement, and the calculation method. In Section 3, we show the experimental results and discuss their significance. The observed unusual beam pattern, the experimentally measured omnidirectional band structure, and the calculated structure are discussed. Finally, concluding remarks are presented in Section 4.
2. Evaluation method
2.1 Device structure
As shown in Fig. 1(a) , the device structure comprised a 2D PC layer placed near the active layer between two cladding layers. The PC was patterned by electron-beam lithography using a resist, and the pattern was transferred by dry etching on the PC layer. The PC area was square shape and had an area of 400 × 400 μm. As seen in the scanning electron microscope image in Fig. 1(b), the pattern comprised a triangular lattice with a lattice constant of 336 nm and a filling factor, i.e., the area ratio of the trapezoid shape, of 20%. The bottom p-electrode had an area of 200 × 200 μm. Since the distance between the active layer and the p-electrode was small (approximately 2 μm), the injected current covered an area almost equal to that of the p-electrode. Light was generated over this area and output via a window in the top n-electrode.
2.2 Measurement of beam pattern
The beam pattern was observed by a beam profiler (A3267-15, Hamamatsu Photonics) through a neutral density (ND) filter in order to extract the unusual beam pattern around the very strong central peak.
2.3 Measurement of omnidirectional band structure
The band structure was evaluated by measuring the angular distribution of spontaneous emission spectra below the lasing threshold [18] using the system shown in Fig. 2 . In this setup, an optical fiber is mounted on a rotating arm with a collimation lens. Emission from the device in a specific direction is measured by a multi-channel spectrometer through the optical fiber. We set the spherical polar coordinates around the device as shown in Fig. 2. The polar angle θ and the azimuthal angle ϕ are transformed into the normalized wavevector (kx, ky) on the reciprocal lattice space as follows:
where kx is the wavevector parallel to the Γ–J direction, ky is the wavevector parallel to the Γ–X direction, a is the lattice constant, and λ is the oscillation wavelength in air. Wavelength λ is also transformed into the normalized frequency f as follows:The polar angle θ is varied from −10° to 10° in intervals of 0.1°, and the azimuthal angle ϕ is varied from −90° to 90° in intervals of 1°.The measurement results for the omnidirectional band structures were plotted on 2D planes by cutting the 3D arrays (kx, ky, f) vertically or horizontally. When a vertical cross section of the omnidirectional band structure is plotted for a highly symmetric direction, such as the Γ-X or Γ-J direction, it becomes a normal (or conventional) band structure. An important point here is that we simultaneously extract the horizontal cross sections (or equal frequency bands) in order to clarify the origin of the unusual lasing patterns.
2.4 Calculation of omnidirectional band structure
In the real space and reciprocal lattice space of the triangular photonic crystal (Figs. 3(a) and 3(b), respectively), a1 and a2 are the primitive translation vectors and b1 and b2 are the primitive reciprocal lattice vectors. There are six highly symmetric directions, i.e., Γ–X, Γ–X′, Γ–X″, Γ–J, Γ–J′, and Γ–J″ directions. It should be noted that because of the asymmetric nature of the trapezoidal holes, it is necessary to distinguish these six directions, although three Γ–X or Γ–J directions are equivalent in the case of the rotationally symmetric holes.
We use the 2D plain-wave expansion method to calculate the band structure. Since we used an active layer in which the transverse electric (TE) mode is likely to oscillate, the equation for the magnetic wave in the surface normal direction (Hz) is used as follows [20]:
where G and G′ are the reciprocal lattice vectors, k is the wavevector, ω is the normalized angular frequency, c is the velocity of light, and κ(G) is the Fourier coefficient of the reciprocal of the dielectric constant ε(r), which is explained as follows:where r is the spatial coordinate. We use the modified dielectric constant for ε(r) [18] to reflect the 3D structure of the device in the 2D calculation. It is 11.05 and 11.47 for the inside and the outside of the trapezoid shape, respectively. The number of plane waves is 225. An analytical expression for κ(G) for the trapezoid shape is given in the Appendix.3. Results and discussion
3.1 Beam pattern
Figures 4(a) and 4(b) show the lasing beam patterns through the ND filters implemented with optical densities (ODs) of eight and five, respectively. These measurements were made under continuous wave (CW) operation (100 mA) at room temperature. In Fig. 4(b), we can clearly observe an unusual dual-streak pattern around the central main peak. It should be noted that the intensity of the unusual pattern is 103–105 times lower than that of the central peak.
3.2 Band structure
We carried out the evaluation of the band structure to clarify the origin of the unusual lasing beam patterns in two-step approach. First, the experimental and theoretical band structures are compared. Next, the relationship between the unusual lasing beam pattern and the band structure are discussed.
We measured the omnidirectional band structures, as shown in Fig. 5 , using the method described in Section 2.3. As we mentioned in section 2.4, due to the PC is rotational asymmetric, we measured the omnidirectional band structure for all horizontal directions. The lasing threshold was CW 95 mA. We measured the omnidirectional band structure under CW 93 mA (less than the lasing threshold) and the lasing spectrum under CW 100 mA (above the lasing threshold). There are six bands labeled A, B, C, D, E and F from bottom to top. The dashed box indicates the equi-frequency plane of the lasing frequency. From the vertical cross section and lasing spectrum shown in Figs. 6(a) and 6(b), respectively, we can see that lasing occurs at the edge of the lowest band (labeled Band A in Fig. 6(a)). Moreover, the horizontal cross section at the lasing frequency (0.3433 c/a; Fig. 7 ) shows a pattern similar to that observed in Fig. 4(b).
Then, we calculated the omnidirectional band structure for six bands (bands A, B, C, D, E, and F) around the second-order Γ point, as shown in Fig. 8 . Band A, which is the main band related to lasing oscillation, has the shape of a six-sided pyramid, as shown in Fig. 8(a), and lasing oscillation occurs at the top. Bands B and C has six ridges that are convex upward (it has components along directions other than the specific directions Γ–X and Γ–J for the lasing frequency). In addition, we calculated the plots for bands A, B, and C at the frequency at the top of band A (0.3412 c/a), as shown in Fig. 9 . The difference from the measured value should come from estimation error of the refractive index. Figure 9 can be directly compared with Fig. 7 and shows good correspondence with it. Therefore, we found that Fig. 7 corresponds to the plots of bands A, B, and C at the lasing frequency, where the omnidirectional band structures of bands B and C are shown in Figs. 8(b) and 8(c), respectively.
These results indicate that the non-lasing bands (bands B and C) may diffract the laser beam to generate the dual-streak pattern. Here, we note that the wavenumber of band C is significantly distant from that of the Γ point of band A, and so, ideally, the laser light cannot be scattered by band C. Therefore, we suggest that some scattering mechanisms might be present to broaden the wavenumber. For example, if some imperfections are made in the PC structure during fabrication processes (for example, electron-beam lithography, dry etching, and so on), they works as scattering centers. The wavenumber of the lasing light scattered at the scattering centers will be broaden.
From these results, it is expected that noiseless high-quality 2D PC lasers are always obtained (so far, dual-streak noise pattern is occasionally observed) by designing the PC structure in which there is no other band structures near the lasing point on horizontal cross section of the lasing frequency (a detailed discussion and experimental results will be given elsewhere).
4. Summary
We investigated the effects of a non-lasing band in 2D PC lasers. An occasionally observed very weak dual-streak pattern around the strong main peak has the same frequency as the main peak and might be caused by the non-lasing band, even though the wavenumber is significantly different. This result indicates a new direction of a designing method of 2D PC lasers to avoid weak dual-streak pattern. Therefore, this paper will contribute to stable developing of high-power, high-quality surface emitting lasers. In addition, we believe that the method of omnidirectional measurement of the band structure will also be useful for developing various high-functionality PC lasers, including beam-steering lasers that contain dual periods [14, 17] as it provide not only along special directions but also comprehensive information about the band structure.
Appendix
Fourier expansion of trapezoid
As shown in Eq. (5), to calculate the band structure by the 2D plain-wave expansion method, the Fourier expansion of the reciprocal of the dielectric constant should be obtained. We derive the expression for a complicated trapezoid shape by dividing the shape into a rectangle and a right-angled triangle, as shown in Fig. 10 .
The primitive translation vectors a1 and a2 in Fig. 3(a) are expressed as follows:
where a is the lattice constant. Then, the primitive reciprocal lattice vectors b1 and b2 in Fig. 3(b) are expressed as follows:Therefore, the reciprocal lattice vector G in Eqs. (4) and (5) is expressed as follows:where m and n are integers. The Fourier coefficient κ(G) is given as follows:where a2sin60° corresponds to the area of a unit cell, and Δε is the difference in the dielectric constant between the inside and outside of the shape.First, we calculate the Fourier coefficient κ1(G) for the rectangular shape shown in Fig. 11(a) . To avoid dividing by zero, the results for four cases should be considered separately as follows:
Then, the Fourier coefficient κ2(G) for the shifted rectangle shown in Fig. 11(b) can be simply calculated as follows:
Next, we calculate the Fourier coefficient κ3(G) for the right-angled triangular shape shown in Fig. 11(c) as follows:
Finally, the Fourier coefficient κ4(G) for the trapezoid is simply given by the sum of those for the shifted rectangle and the right-angled triangle as follows:
Acknowledgments
The authors express their thanks to A. Higuchi, S. Furuta, K. Shibata, and K. Masuda for carrying out laser processing.
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