Abstract
A method is presented to determine simultaneously the temperature distribution and the intrinsic emissivities of a cavity surface when radiance distributions along the cavity wall for two wavelengths are given. The intrinsic emissivity and reflection characteristics are assumed not to depend on position on the cavity wall. The intrinsic emissivity and reflection characteristics giving the smallest difference between calculated temperature distributions for the two wavelengths are found. The values found and thus the temperature distributions are verified to be close to the true ones. The method is examined on a cylindrocone by a simulation and applied to radiance temperature distributions measured on a commercially available double cone.
© 2000 Optical Society of America
Full Article |
PDF Article
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Tables (5)
You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Equations (30)
You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription