Abstract
In this article, we design and demonstrate new angled multimode interference (MMI) couplers in silicon-on-insulator that allow arbitrary selection of coupling ratios, while simultaneously achieve low-chromaticity response and improved fabrication variations tolerance. The proposed couplers rely on paired-interference design approach in tandem with a new angled multi-mode junction to mitigate chromatic aberration and geometry-induced waveguide modal shift in conventional angled MMI coupler design. Test devices with footprint of 4.8 μm × 75 μm showed full coupling ratio range addressability with insertion loss below 1.2 dB. Spectral responses across the extended C band (1525 nm – 1575 nm) were also characterized, where coupling ratio varied by less than 2.3% across the spectral region of interest. Furthermore, coupler characteristics variations against line-width and thickness deviations are numerically analyzed, demonstrating robustness within typical fabrication tolerances.
PDF Article
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription