Abstract
A new integrated gate driver has been successfully designed and fabricated by
amorphous silicon (a-Si) technology for a 3.8-in WVGA $(800\times\hbox{RGB}\times 480)$
TFT-LCD panel. With the proposed threshold voltage drop-cancellation technique, the
output rise time of the proposed integrated gate driver can be substantially decreased
by 24.6% for high-resolution display application. Moreover, the proposed noise reduction
path between the adjacent gate drivers can reduce the layout area for slim bezel
display. The transmittance brightness and contrast ratio of the demonstrated 3.8-inch
panel show almost no degradation after the 500 h operation under 70 °C
and -20 °C conditions.
© 2011 IEEE
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