Abstract
Inline quality control of liquid crystal (LC) cells is usually
associated with a real-time noncontact characterization of moved LC
cells. Such a characterization enables inspection of the products
quality and helps to find in time defects. In the paper, we analyze
an approach for fast evaluation of LC cell gap uniformity. The approach
is based on detecting interference patterns formed by the quasi-monochromatic
light reflected from a tested LC cell. To speed up the data treatment,
a simple analytic expression describing the intensity of light interacting
with the multilayered structure of an LC cell is derived. The results
of the simplified model are compared with rigorous simulations. Two
experimental setups are discussed. A CCD camera is used for detecting
the interference patterns.
© 2015 IEEE
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