Abstract

Optical systems often suffer from optical aberrations caused by imperfect hardware, which places significant constraints on their utility and performance. To reduce these undesirable effects, a comprehensive understanding of the aberrations inherent to optical systems is needed. This article presents an effective method for aberration detection using Zernike polynomials. The process involves scanning the object plane to identify the optimal focus and subsequently fitting the acquired focus data to Zernike polynomials. This fitting procedure facilitates the analysis of various aberrations in the optical system.

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