Abstract
In this study, a multitechnique surface analytical approach is used to provide comprehensive surface molecular, structural, and thermodynamic information of a segmented Poly(etherurethane) (PEU) block copolymer (Texin-985). Through sample preparation methods described in this paper, a clean stable PEU material is provided. Subsequent analysis employing Electron Spectroscopy for Chemical Analysis (ESCA), Attenuated Total Reflectance Fourier Transform Infrared (ATR/FT-IR), and Comprehensive Wettability Profiling provides a comprehensive molecular structure of the topmost interfacial region, ranging through a bulk analysis probing depths in the micron range. Also featured in this paper are results obtained through the implementation of a higher-energy x-radiation source for ESCA analysis. Through the use of angle-dependent ESCA utilizing Mg Kα x-radiation, used in conjunction with a Ti Kα x-radiation source, a hard- and soft-component depth profile expanded from a conventional profile of ∼20 Å to 100 Å (using a Mg anode source) to ∼20 Å to 200 Å is obtained. Due to the greater depth of analysis, we also obtain atomic ratios (using calculated sensitivity factors) which are closer to true bulk atomic percentages of Texin-985 (PEU).
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