Abstract
The angle of incidence of minimum reflectance for incident unpolarized
or circularly polarized light at a dielectric-conductor interface is determined
for any complex relative refractive index , and contours of constant
in the plane are presented. The minimum reflectance
at is also plotted as a function of the polar
angle along each constant contour. Also presented are families of
-versus- curves for values of complex
at , to 85° in steps of 10°, and values of
complex at , to 90° in steps of 10°. Finally, a
nonpolarimetric method for the determination of and of optical materials, which is based on
measurements of and the normal-incidence reflectance
, is proposed.
© 2014 Optical Society of America
Full Article |
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Figures (11)
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Tables (2)
You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Equations (16)
You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription