Abstract
Electronic speckle pattern interferometry and digital holographic interferometry are investigated at long infrared wavelengths. Using such wavelengths allows one to extend the measurement range and decrease the sensitivity of the techniques to external perturbations. We discuss the behavior of reflection by the object surfaces due to the long wavelength. We have developed different experimental configurations associating a laser emitting at and microbolometer arrays. Phase-shifting in-plane and out-of-plane electronic speckle pattern interferometry and lensless digital holographic interferometry are demonstrated on rotation measurements of a solid object.
© 2010 Optical Society of America
Full Article | PDF ArticleMore Like This
Igor Alexeenko, Jean-François Vandenrijt, Giancarlo Pedrini, Cédric Thizy, Birgit Vollheim, Wolfgang Osten, and Marc P. Georges
Appl. Opt. 52(1) A56-A67 (2013)
Marc P. Georges, Jean-François Vandenrijt, Cédric Thizy, Yvan Stockman, Patrick Queeckers, Frank Dubois, and Dominic Doyle
Appl. Opt. 52(1) A102-A116 (2013)
Marc P. Georges, Jean-François Vandenrijt, Cédric Thizy, Igor Alexeenko, Giancarlo Pedrini, Birgit Vollheim, Ion Lopez, Iagoba Jorge, Jonathan Rochet, and Wolfgang Osten
Opt. Express 22(21) 25517-25529 (2014)