Abstract
We used surface thermal lensing (STL) to measure the weak absorption of optical films. Different trends of STL phase signals were observed in films with two types of defect, i.e., absorptive defects and heat-resistant defects. Theoretical analysis was made, and it is in good agreement with the experimental results. Therefore, an enhanced STL technique is proposed to deduce both the magnitude of absorption and the type of defect in optical films, by considering signal intensity with its phase status.
© 2010 Optical Society of America
Full Article |
PDF Article
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Equations (2)
You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription