Abstract
In connection with the design of a hard-x-ray telescope for the Constellation X-Ray Observatory we measured the reflectivity of an iridium-coated zerodur substrate as a function of angle at 55, 60, 70, and 80 keV at the National Synchrotron Light Source of Brookhaven National Laboratory. The optical constants were derived from the reflectivity data. The real component of the index of refraction is in excellent agreement with theoretical values at all four energies. However, the imaginary component, which is related to the mass attenuation coefficient, is 50% to 70% larger at 55, 60, and 70 keV than theoretical values.
© 2006 Optical Society of America
Full Article | PDF ArticleMore Like This
Hisamitsu Awaki, Hideyo Kunieda, Manabu Ishida, Hironori Matsumoto, Yasunori Babazaki, Tadatsugu Demoto, Akihiro Furuzawa, Yoshito Haba, Takayuki Hayashi, Ryo Iizuka, Kazunori Ishibashi, Naoki Ishida, Masayuki Itoh, Toshihiro Iwase, Tatsuro Kosaka, Daichi Kurihara, Yuuji Kuroda, Yoshitomo Maeda, Yoshifumi Meshino, Ikuyuki Mitsuishi, Yuusuke Miyata, Takuya Miyazawa, Hideyuki Mori, Housei Nagano, Yoshiharu Namba, Yasushi Ogasaka, Keiji Ogi, Takashi Okajima, Shigetaka Saji, Fumiya Shimasaki, et al.
Appl. Opt. 53(32) 7664-7676 (2014)
Koujun Yamashita, Peter J. Serlemitsos, Jack Tueller, Scott D. Barthelmy, Lyle M. Bartlett, Kai-Wing Chan, Akihiro Furuzawa, Neil Gehrels, Kazutoshi Haga, Hideyo Kunieda, Peter Kurczynski, Gyanendra Lodha, Norio Nakajo, Norihiko Nakamura, Yoshiharu Namba, Yasushi Ogasaka, Takashi Okajima, David Palmer, Ann Parsons, Yang Soong, Carl M. Stahl, Harumi Takata, Keisuke Tamura, Yuzuru Tawara, and Bonnard J. Teegarden
Appl. Opt. 37(34) 8067-8073 (1998)
Takashi Okajima, Keisuke Tamura, Yasushi Ogasaka, Kazutoshi Haga, Seiji Takahashi, Satoshi Ichimaru, Hideo Kito, Shin’ichi Fukuda, Arifumi Goto, Kentaro Nomoto, Hiroyuki Satake, Seima Kato, Yuichi Kamata, Akihiro Furuzawa, Fumie Akimoto, Tsutomu Yoshioka, Kazumasa Kondo, Yoshito Haba, Takeshi Tanaka, Keiichi Wada, Noriyuki Hamada, Murat Hudaverdi, Yuzuru Tawara, Koujun Yamashita, Peter J. Serlemitsos, Yang Soong, Kai-Wing Chan, Scott M. Owens, Fred B. Berendse, Jack Tueller, et al.
Appl. Opt. 41(25) 5417-5426 (2002)