Abstract
Anisotropic in-plane strain arises in quantum-well systems by design or unintentionally. We propose two methods of measuring the in-plane strain anisotropy based on the optical polarization anisotropy that arises with anisotropic in-plane strain. One method uses purely optical means to determine the strain anisotropy in quantum wells under a compressive strain that is spatially varying. A second approach, applicable to quantum wells under tensile strain or with strain that does not vary with position, requires the application of a uniaxial in-plane stress. Although the second method is experimentally more difficult, it allows analysis of systems that would otherwise be inaccessible.
© 2003 Optical Society of America
Full Article | PDF ArticleMore Like This
Mark L. Biermann and W. S. Rabinovich
Opt. Express 10(20) 1105-1110 (2002)
Shu-Wei Chang, Shun Lien Chuang, Connie J. Chang-Hasnain, and Hailin Wang
J. Opt. Soc. Am. B 24(4) 849-859 (2007)
M. Huang
Opt. Lett. 28(23) 2327-2329 (2003)