Abstract
The intrinsic error propagation in a technique that uses total
reflection geometry for the measurement of χ(3) is
calculated. The results show how accurately the parameters should
be measured to obtain the χ(3) value with the
required precision. The film thickness should be slightly less than
the fundamental wavelength to reduce the χ(3) error
that propagates from other parameters.
© 1999 Optical Society of America
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Equations (3)
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