Abstract
An improved system for the separate measurement of the refractive
index and the geometrical thickness that constitutes a hybrid
configuration of a confocal microscope and a wavelength-scanning
heterodyne interferometer with a laser diode is presented. The
optical path difference can be measured in less than 1 s, which is
10 times quicker than with the low-coherence interferometry previously
used, and with a resolution of 10 µm with a fixed reference
mirror. Separate measurement of the refractive index and the
geometrical thickness of glass plates was demonstrated by use of the
arrangement in place of the low-coherence interferometer used
previously.
© 1999 Optical Society of America
Full Article |
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Figures (7)
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Tables (1)
You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Equations (18)
You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription