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Jerry Edelstein, Michael C. Hettrick, Stanley Mrowka, Patrick Jelinsky, and Christopher Martin, "Extreme UV measurements of a varied line-space Hitachi reflection grating: efficiency and scattering; erratum," Appl. Opt. 24, 153-153 (1985)https://opg.optica.org/ao/abstract.cfm?uri=ao-24-2-153
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