Abstract
Constant-psi constant-delta contour maps in the reduced angle-of-incidence–film-thickness plane that are useful in ellipsometry and in design of reflection-type optical devices are discussed. As a specific example, a contour map is given for the SiO2–Si film–substrate system at the 6328-Å He–Ne laser wavelength.
© 1982 Optical Society of America
Full Article | PDF ArticleMore Like This
R. M. A. Azzam, A.-R. M. Zaghloul, and N. M. Bashara
J. Opt. Soc. Am. 65(3) 252-260 (1975)
R. M. A. Azzam and M. Emdadur Rahman Khan
Appl. Opt. 22(2) 253-264 (1983)
A. Rahman M. Zaghloul and Mohamed S. A. Yousef
Appl. Opt. 45(2) 235-264 (2006)