Abstract
This erratum addresses incorrect labeling of crystal axes in our published results [Optica 8, 686 (2021) [CrossRef] ], as well as a mistaken reference in the supplementary document.
© 2024 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
1. LABELING OF CRYSTAL AXES
In Fig. 1 of our article [1], we report that the $\phi = 0^\circ$ direction—i.e., the direction corresponding to the coating flat—is aligned in parallel to the $[{0} \overline{1}\,\overline{1}]$ crystal axis. This was labeled incorrectly due to a misinterpretation of reference drawings. Instead, the coating flat—corresponding to $\phi = 0^\circ$—is aligned to the $[{01\bar 1}]$ axis. Additionally, $\phi = 270^\circ$ is aligned to the $[{011}]$ crystal axis. This is consistent with a $({\bar 100})$-oriented sample during optical testing.This mislabeling is equivalent to a 90° rotation about the $[{100}]$ axis combined with a 180° rotation about the $[{01\bar 1}]$ axis with respect to the original labels. While the structure was indeed grown on a (100)-oriented seed wafer, the top half of the epitaxial structure was flipped during bonding in order to realize the stacked optical coating. This means that the effective crystallographic orientation of the optically probed sample is $({\bar 100})$, consistent with above axis labels.
The mislabeled axes were also used as a basis for the simulations presented in Section 3.D of the original manuscript. Therefore, we ran the simulations again, now using the correct orientation. The new simulations yield results confirming an identical behavior as originally reported but now consistent with the corrected axis labels.
During experimental work, all measurement orientations were recorded as an angle $\phi$ with respect to the coating flat of the final mirror, corresponding to $\phi$ axis labels in the top middle panel of Fig. 1 and Fig. 8 of our original article, both of which remain unchanged.
Since Fig. 1 was used as a reference for aligning angular measurements with nominal crystal axes throughout the article, several corrections are necessary. These corrections are summarized in Table 1.
Except for the orientation corresponding to minimal excess loss, all findings and conclusions of the original publication remain unchanged by this mislabeling.
2. CORRECT REFERENCE
Furthermore, we correct a reference in the supplement of our published article. The only citation in the published supplement points to Ref. [49] of the main manuscript. However, we intended to cite [2]. This is a typographical oversight and has no influence on the presented results.
REFERENCES
1. G. Winkler, L. W. Perner, G.-W. Truong, et al., “Mid-infrared interference coatings with excess optical loss below 10 ppm,” Optica 8, 686–696 (2021). [CrossRef]
2. J. Courtois and J. T. Hodges, “Coupled-cavity ring-down spectroscopy technique,” Opt. Lett. 37, 3354–3356 (2012). [CrossRef]