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La3GaGe5O16:Cr3+ phosphor: the near-infrared persistent luminescence

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Abstract

Long persistent phosphors in the near-infrared (NIR) region have attracted much attention due to the potential application in in vivo imaging. La3GaGe5O16:Cr3+ phosphor presents a NIR long persistent luminescence after the short UV-irradiation. La3GaGe5O16 host also exhibits a cyan persistent luminescence. The optimal concentration of Cr3+ in La3GaGe5O16 is experimentally about 0.01 and the afterglow time can last more than 30 min. The estimated trap depth which varies continuously as a function of delay time is evidence for the presence of a continuous trap distribution. In order to improve the performance of afterglow luminescence of the La3GaGe5O16:Cr3+, we modified composition around Cr3+ by adjusting the Ge/O content. La3GaGe5O16:Cr3+ is shown to be a new near-infrared persistent phosphor potentially suitable for in vivo imaging due to its 650nm-750nm emission range.

© 2016 Optical Society of America

1. Introduction

The long lasting phosphorescence is an interesting optical phenomenon, which is a special case of thermally stimulated luminescence after the stoppage of the excitation source at room temperature. Persistent luminescence phosphors exhibit particular properties of storing light energy such as sunlight or artificial light sources [1,2]. To date, long persistent phosphors have received much attention and interests due to their wide application, e.g., such as emergency escape routes and exit signs, optical energy media, thermal sensors [1–3]. Besides the traditional applications, new fields of interest emerged in medical field such as cancer photodynamic therapy, cancer diagnoses and in vivo imaging [4,5].

Interestingly, the long lasting phosphors (LLPs) have been attracted extensive research interests and attention to in vivo imaging [3–5]. Especially, LLPs in the near infrared (NIR) region have been developed as a new category of luminescent labels which have been becoming promising alternatives to the organic fluorophores and quantum dots applied in biological assays and medical imaging due to their unique optical properties, such as low background autofluorescence, sharp emission band, long luminescent lifetimes, good photostability and low toxicity [6,7]. As a result, the long persistent nature of LLP particles allows optical excitation before bioimaging, and permits detection and imaging without external illumination, thereby avoiding the background noise from in situ excitation [8–10]. Moreover, it is reported that the use of NIR emitting photons is more suitable for biomedical imaging and detection than that of ultraviolet (UV) or visible ones as optical probes [11].

In design of NIR phosphors, interest in Cr3+ activated phosphors is widespread, such as ZnGa2O4:Cr3+ [12], Ca3Ga2Ge4O14:Cr3+ [13], La3Ga5GeO14:Cr3+ [14], La3Ga5.5Nb0.5O14:Cr3+ [15], Zn3Ga2GeO8:Cr3+ [16], etc. These showed that Cr3+ ions would experience the disorder-induced distributions of strong and weak crystal field strengths, resulting in two types of luminescence being observed: sharp R-line (600-700nm) and broad NIR (900-1300 nm) emissions. However, NIR bio-imaging window is composed of two ranges (NIR I, 650-950nm and NIR II, 1000-1400nm) because there is a strong absorption at 980 nm due to water absorption in bio-tissues. It’s no doubt that Cr3+ doped persistent phosphors have attracted extremely attentions for bio-imaging since they are matching well with the NIR bio-imaging window. The past few years have witnessed great progress in the development of the LPP probe in in vivo bioimaging, with the main focus on the Cr3+-activated gallate materials [12–16].

Recently, Xia et al. reported the multi-color emission evolution and energy transfer behavior of La3GaGe5O16:Tb3+,Eu3+ phosphors [17]; La3GaGe5O16:Cr3+ phosphor, reported also by Xia et al., showed a strong NIR emission, only about the photoluminescence properties [18]. In our previous work, we discussed the optical properties of La3GaGe5O16 host and Pr3+-doped La3GaGe5O16 phosphor [19]. However, the long persistent properties of La3GaGe5O16:Cr3+ phosphor was still not studied. In our work, La3GaGe5O16:Cr3+ phosphor was prepared via the solid state reaction and the LLP properties were investigated in detail. La3GaGe5O16:Cr3+ phosphor gives a new near-infrared persistent luminescence, which is potentially suitable for in vivo imaging due to its 650nm-750nm emission range.

2. Experimental

2.1 Synthesis

The samples were prepared by a simple solid state reaction. La2O3(99.99%), Ga2O3 (99.99%), GeO2 (99.99%), H3BO3 (99.99%) and Cr2O3 (99.99%) were used as starting materials. After the raw materials were weighed according to the composition of La3Ga1-xGe5O16:xCr3+(x = 0, 0.005, 0.01, 0.02, 0.03, 0.04, 0.05 and 0.07, etc), the powders were mixed and milled thoroughly for 1h in an agate mortar and prefired at 900°Cfor 8h in air. After ground again, the mixtures were sintered at 1150°Cfor 6h. After being cooled down to room temperature naturally, the as-prepared powder samples were obtained.

2.2 Measurement

The phase purity of the prepared phosphors was measured by an X-ray diffractometer with Cu Ka radiation (wavelength = 0.15406 nm) at 36 kV tube voltage and 20 mA tube current.The morphology of the samples was characterized by S3400N scanning electronic microscope (SEM) with accelerating voltage of 10 kV. Diffuse reflection spectra were obtained by an ultraviolet (UV)-visible spectrophotometer (Shimadzu UV-2450) using BaSO4 as a reference. The excitation and emission spectra of all the samples were measured by a Hitachi F-7000 Fluorescence Spectrophotometer equipped with a 150 W xenon lamp as excitation source. The persistent luminescence spectrum was also measured using the spectrophotometer by shutting off the Xe lamp. The decay curves were measured by a GFZF-2A single-photo-counter system. The thermoluminescence (TL) spectrum was measured with a FJ-427A1 thermoluminescence meter. Prior to the persistent luminescence spectra, decay curve and TL glow curve measurements, the samples were excited for 3 min by a 15 W low-pressure mercury discharge lamp (254 nm). For the TL glow curve measurements, the heating rate was 1°C/s and the range of the measurement is from room temperature to 300°C. A delay for 3 min was used between the irradiation and measurement. All measurements were carried out at room temperature except for the TL spectrum.

3. Results and discussion

3.1 XRD phase

The XRD patterns of the samples, La3Ga1-xGe5O16:xCr3+, are shown in Fig. 1. A single phase of La3Ga1-xGe5O16:xCr3+ is obtained and all the diffraction peaks are in good agreement with with the standard data of La3Ga1Ge5O16 (ICSD#50521), indicating that Cr3+ ions are successfully dissolved into the La3Ga1Ge5O16 host lattice while maintaining the crystal structure intact. For achieving crystallographic data for La3GaGe5O16:Cr3+ sample, we analyzed the XRD of La3GaGe5O16:Cr3+ with the classic Rietveld refining technique in Fig. 1 (b). The refinement started with the crystallographic data of La3GaGe5O16 (ICSD#50521) and all the refinement factors (Rp, Rwp and Rexp are less than 10%) reveal a good quality of fitting. The refining results confirms Cr3+ prefers to substitute for the the Ga3+ site, as shown in Fig. 1(b).

 figure: Fig. 1

Fig. 1 (a) The XRD pattern of La3Ga1-xGe5O16:xCr3+ phosphor and that of ICSD#50521 given for comparison (bottom); (b) Experimental and calculated of the XRD refinement of La3GaGe5O16:0.01Cr.

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3.2 Luminescence properties

In Fig. 2, the photoluminesence excitation (PLE) spectrum consists of three broad excitation band located at 310 nm, 413 nm and 570 nm, which originate from the inner transitions of Cr3+, namely 4A24T1(4P), 4A24T1(4F) and 4A24T2(4F) transitions. Under such different excitation wavelengths, La3Ga1-xGe5O16:xCr3+ phosphor exhibits the same shapes and positions of the emission band besides the intensity of 2E→4A2 transition. The photoluminesence properties of Cr3+ doped La3GaGe5O16 were discussed in Ref [18], so it is discussed on longer in this article. But the PL spectrum (Fig. 2(b)) is a little different from that in Ref [18], the reason for this might be ascribed to the synthesis condition.

 figure: Fig. 2

Fig. 2 The PLE and PL spectra of La3Ga1Ge5O16:Cr3+ at room temperature.

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3.2 Phosphorescence properties

To investigate the persistent luminescence characteristics, the afterglow spectra of La3Ga0.99Ge5O16:0.01Cr3+ and host were recorded after ceasing the irradiation. As shown in Fig. 3(a)-3(b), La3Ga0.99Ge5O16:0.01Cr3+ sample shows a bright NIR persistent emission, which is similar in shape and position to the emission spectrum. For better understanding of the LPP of La3GaGe5O16:Cr3+ phosphor, La3GaGe5O16 host was also observed a cyan afterglow luminescence. At the bottom in Fig. 3(a)-3(b), the images were recorded by a classic digital camera varying with the different afterglow times. We can see that La3Ga0.99Ge5O16:0.01Cr3+ gives a bright red afterglow emission. In order to study the afterglow decay behaviors and the concentration quenching of La3Ga1-xGe5O16:xCr3+ (x = 0,0.005, 0.01, 0.02, and 0.03) phosphors in detail, the afterglow decay curves of samples are measured at room temperature. Figure 3(c) gives the afterglow decay curves of La3Ga1-xGe5O16:xCr3+ (x = 0,0.005, 0.01, 0.02,and 0.03) after irradiation by a 15 W low-pressure mercury discharge lamp for 3 min. For higher concentration (x = 0.03), the persistent emission is too weak to be observed by human naked eyes. As usual, the afterglow decay processes can be considered to be two parts: one part is a fast decay process and the other is a slow decay part. However, the afterglow duration is largely dependent on the slow decay part. From Fig. 3, we can see that the doping concentration of Cr3+ has an influence on the persistent luminescence properties and the optimal doping concentration of Cr3+ in La3GaGe5O16 host is about 0.01 due to the highest intensity and slowest decay process.

 figure: Fig. 3

Fig. 3 (a-b) the afterglow emission and images of La3Ga0.99Ge5O16:0.01Cr3+ at different time; (c) The afterglow decay curves of La3Ga1-xGe5O16:xCr3+ (x = 0, 0.005, 0.01, 0.02, 0.03 and 0.05) at room temperature, respectively.

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Since the afterglow emission involves the releasing and trapping of electrons or holes from traps under thermal energy excitation, we can gain insight into some useful information about the traps, such as the evaluating for the depth and density of traps in host material by the TL curves [20]. Figure 4(a) shows the TL glow curves of samples La3Ga1-xGe5O16:xCr3+ (x = 0.005, 0.01, 0.02, and 0.03) recorded from 30 to 300°C (the heating rate was 1°C/s). As a rule, each TL peak stands for a kind of trapping centers and the relative trap density or trapping capacity is roughly proportional to the integral TL intensity [7]. In Fig. 4(a), the shape and position of TL curves were found to be almost identical. So, one can see that the depths of TL bands are independent on the doping concentration of Cr3+, but the trap density is largely dependent on the Cr3+-doped content. Obviously, the integral TL intensity of La3Ga0.99Ge5O16: 0.01Cr3+ sample is the largest among the samples. This further confirms that the optimal doping concentration of Cr3+ is about 0.01. In order to further investigate the TL curve, we measured the TL curves of the typical sample La3GaGe5O16:0.01Cr3+ at different delay time in order to clarify the types and kinetic process of traps, as shown in Fig. 4(b). Notably, the position of the TL curve shifts to the higher temperature region with elapse of time. This shift gives us a hint that the estimated trap which varies continuously as a function of delay time is an evidence for the presence of a continuous trap depth distribution. In order to achieve a quantitative analysis of the TL curves, the deconvolution method was used [21,22]. This yields a good agreement between the experimental and calculated glow curves between 0.78 eV and 0.89 eV. The reason for the shift of TL curves is that the trapped electrons escape from the shallower traps much faster than that trapped in the deeper ones. In order to clarify the origin of the defect traps, the TL glow curve of undoped La3GaGe5O16 host was measured as well. From Fig. 4(c) and (d), we can see that shape and position between curve A of La3Ga0.99Ge5O16: 0.01Cr3+ and TL curve of La3GaGe5O16 host are similar and infer that the traps, corresponding to curve A, might originate from the host. The short-wavelength UV radiation can lead to a decrease of the doped Cr3+ concentration as a result of change in their valence state to Cr2+ and Cr4+ [22], So, the doped Cr3+ ions under illumination not only serve deep acceptor centers, forming Cr4+, but act as electron traps, forming Cr2+ (Cr3+-e) [22]. Thus, curve B can be attributed to the traps introduced by the Cr3+ ions.

 figure: Fig. 4

Fig. 4 (a) The thermoluminescence (TL) glow curves of La3Ga1-xGe5O16:xCr3+ (x = 0, 0.005, 0.01, 0.02, and 0.03) at waiting time of 3 min after the removal of excitation; (b) TL glow curves of La3Ga0.99Ge5O16:0.01Cr3+ at different delay times (t = 0.5, 1, 3, 5, 10 and 15min);(c) TL glow curves of the typical sample La3Ga0.99Ge5O16: 0.01Cr3+, the square dots are the measured data, the red and blue solid lines are the Gaussian curves;(d) TL glow curves of un-doped La3GaGe5O16 sample .

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We aim to improve the performance of the La3GaGe5O16:Cr3+ by modified composition around Cr3+ by adjusting the Ge/O content, since the intrinsic traps of host has an important influence on its persistent luminescence. Thus, we prepared a series of Cr3+-doped La3Ga0.99Ge5+xO16+4x:0.01Cr3+ (−0.05≤x≤0.05) samples. persistent luminescence of La3Ga0.99Ge5+xO16+4x:0.01Cr3+ (−0.05≤x≤0.05) are presented in Fig. 5. From Fig. 5, one can see that Ge/O content deficiency benefits to improve the persistent luminescence and afterglow time, whereas samples with a composition of Ge/O content excess exhibit poor afterglow properties. This one aspect demonstrates the persistent luminescence of La3GaGe5O16:Cr3+ is closely related to the oxygen or germanium vacancy deficiency in host. In order to evaluate the phosphorescence of La3GaGe5O16:Cr3+ phosphor, either the persistent luminescence intensity or afterglow time of La3GaGe5O16:Cr3+ cannot match that of the known deep-red persistent phosphor ZnGa2O4:Cr3+, as shown in Fig. 6.

 figure: Fig. 5

Fig. 5 Red emission images of La3GaGe5+xO16+4x:0.01Cr3+ (−0.05≤x≤0.05) recorded by a classic Reflex digital camera with the same exposure time varying with the different afterglow time (t = 0.5, 3, 5, 10 and 15 min)

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 figure: Fig. 6

Fig. 6 The afterglow curves of ZnGa2O4:Cr3+ and La3GaGe5O16:Cr3+.

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3.3 Mechanism of persistence luminescence

To understand the dynamical process in persistent luminescence, a schematic graph based on the above results is proposed and illustrated in Fig. 7. The relative positions of the traps with respect to the bottom of conduction band can be determined based on the TL peaks. It is difficult to identify the position or the location of different energy levels of Cr3+, especially the energy gap between the top of valence band (VB) and the ground state of Cr3+ (4A2), and also the energy gap between the bottom of conduct band (CB) and 4T1 state of Cr3+. Therefore, just for illustration purpose, the Cr3+ energy levels are placed into the middle of the forbidden zone to discuss the afterglow luminescence. After irradiation with the ultraviolet light, the ground electrons of Cr3+ are excited along path 1 to the 4T1 excited state, the latter lying in the conduction band. This leads to a separation of the electrons and holes. The majority of excited electrons will be back and then relax to 2E level in non-radiative way. The subsequent jumping of electrons to the ground levels 4A2 of Cr3+ and recombination of holes lead to the characteristic emission of Cr3+ ions (process numbered 2 and 3). These processes present photoluminescence emission of La3GaGe5O16:Cr3+. However, The residual minority excited electrons relax to the lower end of the conduction band and then are captured by the traps through the non-radiative way (process numbered 4 and 5). The trapped electrons will jump to the neighboring traps by quantum tunneling due to these traps with continuous distribution and close depths. At last, the electrons captured by the traps escape thermally via the conduction and are transferred to the activators Cr3+, followed by the recombination between electrons and holes and resulting in the persistent emission.

 figure: Fig. 7

Fig. 7 Schematic illustration of the trapping and releasing processes of La3GaGe5O16:Cr3+ phosphor.

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4. Conclusions

In conclusion, a novel NIR persistent phosphor La3GaGe5O16:Cr3+ was prepared by the simple solid-state reaction. La3GaGe5O16:Cr3+ phosphor gives a long persistent NIR luminescence, which makes it potential candidates for their application in security, dark/night vision, or medical imaging. We also observed a long afterglow luminescence from the La3GaGe5O16 host. The spectroscopic study revealed fundamental information about the persistent luminescence features of Cr3+ ions in La3GaGe5O16. The optimal concentration of Cr3+ in La3GaGe5O16 is experimentally about 0.01 and the afterglow time can last more than 30 min. In order to improved the performance of the La3GaGe5O16:Cr3+, we modified composition around Cr3+ by adjusting the Ge/O content.The trapping and releasing processes of trapped electrons were discussed, and a model for the illustration of long persistent luminescence mechanism was proposed.

Acknowledgments

This work is financially supported by the National Natural Science Foundation of China (No. 21471038); The Special Funds for University Discipline and Specialty Construction of Guangdong Province, China (No. 2013KJCX0066).

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Figures (7)

Fig. 1
Fig. 1 (a) The XRD pattern of La3Ga1-xGe5O16:xCr3+ phosphor and that of ICSD#50521 given for comparison (bottom); (b) Experimental and calculated of the XRD refinement of La3GaGe5O16:0.01Cr.
Fig. 2
Fig. 2 The PLE and PL spectra of La3Ga1Ge5O16:Cr3+ at room temperature.
Fig. 3
Fig. 3 (a-b) the afterglow emission and images of La3Ga0.99Ge5O16:0.01Cr3+ at different time; (c) The afterglow decay curves of La3Ga1-xGe5O16:xCr3+ (x = 0, 0.005, 0.01, 0.02, 0.03 and 0.05) at room temperature, respectively.
Fig. 4
Fig. 4 (a) The thermoluminescence (TL) glow curves of La3Ga1-xGe5O16:xCr3+ (x = 0, 0.005, 0.01, 0.02, and 0.03) at waiting time of 3 min after the removal of excitation; (b) TL glow curves of La3Ga0.99Ge5O16:0.01Cr3+ at different delay times (t = 0.5, 1, 3, 5, 10 and 15min);(c) TL glow curves of the typical sample La3Ga0.99Ge5O16: 0.01Cr3+, the square dots are the measured data, the red and blue solid lines are the Gaussian curves;(d) TL glow curves of un-doped La3GaGe5O16 sample .
Fig. 5
Fig. 5 Red emission images of La3GaGe5+xO16+4x:0.01Cr3+ (−0.05≤x≤0.05) recorded by a classic Reflex digital camera with the same exposure time varying with the different afterglow time (t = 0.5, 3, 5, 10 and 15 min)
Fig. 6
Fig. 6 The afterglow curves of ZnGa2O4:Cr3+ and La3GaGe5O16:Cr3+.
Fig. 7
Fig. 7 Schematic illustration of the trapping and releasing processes of La3GaGe5O16:Cr3+ phosphor.
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