Abstract
We present measurements of morphological features in a thick turbid sample using light-scattering spectroscopy (LSS) and Fourier-domain low-coherence interferometry (fLCI) by processing with the dual-window (DW) method. A parallel frequency domain optical coherence tomography (OCT) system with a white-light source is used to image a two-layer phantom containing polystyrene beads of diameters 4.00 and on the top and bottom layers, respectively. The DW method decomposes each OCT A-scan into a time–frequency distribution with simultaneously high spectral and spatial resolution. The spectral information from localized regions in the sample is used to determine scatterer structure. The results show that the two scatterer populations can be differentiated using LSS and fLCI.
© 2010 Optical Society of America
Full Article | PDF ArticleMore Like This
Robert N. Graf and Adam Wax
Opt. Express 13(12) 4693-4698 (2005)
Adam Wax, Changhuei Yang, and Joseph A. Izatt
Opt. Lett. 28(14) 1230-1232 (2003)
Francisco E. Robles, Yizheng Zhu, Jin Lee, Sheela Sharma, and Adam Wax
Biomed. Opt. Express 1(2) 736-745 (2010)