Abstract
We demonstrate subcentimeter depth profiling at a stand off distance of using a time-of-flight approach based on time-correlated single-photon counting. For the first time to our knowledge, the photon-counting time-of-flight technique was demonstrated at a wavelength of using a superconducting nanowire single-photon detector. The performance achieved suggests that a system using superconducting detectors has the potential for low-light-level and eye-safe operation. The system’s instrumental response was full width at half-maximum, which meant that surface-to-surface resolution could be achieved by locating the centroids of each return signal. A depth resolution of was achieved by employing an optimized signal-processing algorithm based on a reversible jump Markov chain Monte Carlo method.
© 2007 Optical Society of America
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