Abstract
We present, for what is to our knowledge the first time, the theoretical calculations of the ellipsometric parameters of a single nonlinear layer–substrate system (Fabry–Perot cavity) and of a nonlinear attenuated total internal reflection configuration. Using an analytical solution of the nonlinear wave equation in a medium with a weak third-order nonlinearity of thermal origin, we can determine theoretically the ellipsometric parameters for an incident linearly polarized monochromatic plane wave. We show that the sensitivity of the ellipsometric parameters with respect to the input flux and to changes of the nonlinear coefficient depends strongly on the sharpness of the linear resonances of the system. We propose ellipsometric experiments that permit the determination of small nonlinear coefficients.
© 1993 Optical Society of America
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