Abstract
No abstract available.
Full Article | PDF ArticleMore Like This
Film Thickness Measurements for Infrared Spectrophotometry
J. H. Peterson and J. R. Downing
J. Opt. Soc. Am. 41(11) 862_2-863 (1951)
The Shape of Reflected Interference Fringes from Interferometers Coated with Thin Metal Films
J. Holden
J. Opt. Soc. Am. 41(8) 504-510 (1951)
The Impedance Concept in Thin Film Optics
Paul J. Leurgans
J. Opt. Soc. Am. 41(10) 714-717 (1951)