Abstract
Single-spatial mode lasers emitting at 980 nm are studied during continuous-wave long-term operation and ultra-high power short-term operation (stress-test) up to 13.5 W. We find that both tests eventually activate the same degradation mechanism, namely internal catastrophic optical damage. In the case of ultra-high power operation, we show that the mechanism that initializes this effect is a lateral widening of the optical mode, resulting in increased absorption outside the waveguide. Defects formed during long-term aging may eventually lead to the same effect. Stress testing allows for activation of several degradation mechanisms in a device one after the other and for distinguishing between mechanisms induced by aging and independent ones. Stress tests could pave the way toward more time-efficient testing, e.g., for comparison of different technology variants in development.
© 2015 IEEE
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription