Abstract
Refractive index in special optical-damage-resistant MgO-diffused
near-stoichiometric (NS) Ti:LiNbO<sub>3</sub> (Ti:LN) waveguide structure that a number
of single-mode strip waveguides are embedded in a planar waveguide is profiled on the
basis of the measured mode field profile of strip waveguide. In the NS strip waveguide,
the Ti<sup>4+</sup>-induced extraordinary index increase studied follows a sum of two error
functions in the width direction and a sum of two Gaussian functions in the depth
direction. In the NS planar waveguide, the index increase follows a Gaussian function.
On the basis of the established index profile model, the mode field profiles were
calculated using variational method and compared with the measured data. The results
show that the calculated mode sizes are in good agreement with the measured. In
addition, the profile characteristics of Ti<sup>4+</sup>-concentration in both the strip and
planar waveguides were analyzed by secondary ion mass spectrometry and are correlated
with the refractive index increase. The result shows that the profile characteristics of
the index increase and Ti<sup>4+</sup>-concentration are similar for both the strip and
planar waveguides and there exists a linear relationship with a slope of
~2.0 × 10<sup>-3</sup>(mol%)<sup>-1</sup>.
© 2012 IEEE
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