Abstract
The critical findings associated with end-face total internal reflection
(TIR) phenomemon we proved before are reported. In particular, these findings reveal
that the end-face-TIR capable rays experience enormous mode mixing when encountering
a roughened end face. As a result, 94% of the overall detectable power is
contributed by this effect. With a smooth fiber end face, this figure is mere 52%.
We interpret the mechanism behind these unusual phenomena and its significance for
the performance enhancement of fiber optic evanescent wave sensor.
© 2011 Chinese Optics Letters
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription