Abstract
A metal-overlayer infrared ATR technique proposed by Ishino and Ishida is one of the infrared reflection spectroscopies comprising the Ge prism/thin film/metal overlayer sample system and is expected to be a powerful tool for studying ultrathin organic films because of its high sensitivity. Since, in this case, the surface selection rule is valid, as in the case of conventional infrared reflection-absorption (RA) spectroscopy, it is also useful in providing information on the molecular structure and orientation in the films. Using this technique, Ishino and Ishida succeeded in obtaining high-quality infrared spectra of a thin (10-nm thick) cast film of poly(vinyl acetate) (PVAc) as well as a two-monolayer Langmuir-Blodgett (LB) film of cadmium arachidate directly deposited on a Ge prism, followed by a vacuum evaporation of a silver overlayer (20-nm thick) on the sample films. The signal-to-noise (S/N) ratio thus obtained was estimated to be five times better than that achieved by RA spectroscopy.
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription