Abstract

The far-visible (short wave or near, near-infrared or Herschel-infrared) region (∼700–1100 nm) of the electromagnetic spectrum is becoming increasingly popular with spectroscopists, as noted by recent publications and by the inclusion of this region in the coverage range of many more commercial instruments (e.g., NIRSystems, Hewlett-Packard). The region is of particular interest for process analytical chemists, since common visible-region light sources, optics, and detectors may be used, making instrumentation simpler and less expensive than that required for the traditional near- or mid-infrared. This increased simplicity is particularly valuable in process applications because the instruments must operate continuously, 24 hours a day, 365 days a year. In addition, reasonably priced optical fibers, with low light losses, are available for this spectral region, which is not the case yet in the mid-infrared. (This further increases this spectral region's attractiveness for process monitoring applications.) In addition, many of the absorption bands are fairly sharp, so that simple filter photometers may be amenable to process measurements in this region.

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Fast computation of the Narcissus reflection coefficient for the Herschel far-infrared/submillimeter-wave Cassegrain telescope

Robert L. Lucke, Jacqueline Fischer, Arturo M. Polegre, and Douwe A. Beintema
Appl. Opt. 44(28) 5947-5955 (2005)