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  • Applied Spectroscopy
  • Vol. 41,
  • Issue 2,
  • pp. 312-313
  • (1987)

The Application of Inductively Coupled Plasma Atomic Emission Spectrometry and a Sequential Spectrometer for Thallium Determination in Cadmium Anodes

I. B. Brenner, S. Erlich, J. R. Goldstein, H. Bezalel, and P. Dan

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Abstract

Inductively coupled plasma atomic emission spectrometry is increasingly relied upon for the analysis and characterization of metallurgical and related materials, from the raw material to the finished product. However, descriptions of the analysis of metal products related to the electronics industry are scant.

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