Abstract
This publisher’s note amends the page range in Appl. Opt. 58, A26 (2019) [CrossRef] .
© 2019 Optical Society of America
In Ref. [1], the number of the last page was corrected. The article was corrected online on 21 February 2019.
REFERENCE
1. H. Xie, Y. Zhang, L. Kong, P. Xi, and Q. Dai, “Schlieren two-photon microscopy for phase-contrast imaging,” Appl. Opt. 58, A26–A31 (2019). [CrossRef]