Abstract
We track the non-uniformity of a wide area liquid crystal device using multiple cross-polarized intensity measurements. They give us not only accurate estimates of the core physical liquid crystal parameters, such as elastic constants, but also spatial maps of the device properties, including the liquid crystal thickness and pretilt angle. A bootstrapping statistical analysis, coupled with the multiple measurements, gives us reliable error bars on all the measured parameters.
© 2017 Optical Society of America
Full Article | PDF ArticleMore Like This
Denitsa Bankova, Nicolas Brouckaert, Nina Podoliak, Benjamin Beddoes, Eleanor White, Oleksandr Buchnev, Malgosia Kaczmarek, and Giampaolo D’Alessandro
Appl. Opt. 61(16) 4663-4669 (2022)
Keith R. Daly, Nina Podoliak, Oleksandr Buchnev, Malgosia Kaczmarek, and Giampaolo D’Alessandro
J. Opt. Soc. Am. B 29(8) 2166-2175 (2012)
Sheng-Ya Wang, Huang-Ming Wu, and Kei-Hsiung Yang
Appl. Opt. 52(21) 5106-5111 (2013)