Abstract
A method for determination of refractive indices which may be applied to thin flat plates of optical materials is considered. It is particularly suited for use with materials whose refractive indices are large (>1.8), but is not limited in the range of refractive index it can determine. The method uses an interferometer to measure the optical pathlength through a sample, and is shown to have moderate accuracy: ±2 × 10−4 in refractive index for a sample 0.5 mm thick. The effect of a nonideal sample is considered, and is shown to have only a small effect on the accuracy. The method has been applied to single-crystal barium titanate in the visible spectrum, and tabulated results are given.
© 1966 Optical Society of America
Full Article |
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Figures (3)
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Tables (4)
You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Equations (7)
You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription