Abstract
We describe a method of measuring the relative optical phase on reflection between amorphous and crystalline regions of the phase-change media of optical data storage. With a red He–Ne laser (wavelength, 632.8 nm) the relative phases on two quadrilayer optical disk stacks were measured and found to be ∼40°. The results are in good agreement with the calculated values based on the known layer thicknesses and refractive indices of the stacks. For calibration purposes the height of a known step on an otherwise flat silicon substrate was measured with the same apparatus. The proposed method is fairly simple to set up, can measure both front-surface and through-substrate types of optical disk, and can be used with any laser that has long coherence length.
© 2000 Optical Society of America
Full Article | PDF ArticleMore Like This
Chubing Peng and M. Mansuripur
Appl. Opt. 39(14) 2347-2352 (2000)
Chubing Peng and Masud Mansuripur
Appl. Opt. 43(22) 4367-4375 (2004)
Chubing Peng and Masud Mansuripur
Appl. Opt. 41(2) 361-369 (2002)