Abstract
The thickness of a magnetic inert layer on top of a ferrite head sample was measured by probing the longitudinal Kerr effect as a function of the angle of incidence of a laser beam. Our computerized measuring system used a simple single-detector setup to derive polarization information from a Kerr-reflected beam as the incident angle was scanned. The results were analyzed using a general theory of reflection from magnetic stratified media. The experimental results indicate that the possible inert-layer thickness values are given by (50 ± 10) + 60 × N nm, where the order N equals 0, 1, 2, 3, or 4.
© 1987 Optical Society of America
Full Article | PDF ArticleMore Like This
Zhan-Ming Li, Brian T. Sullivan, and R. R. Parsons
Appl. Opt. 27(7) 1334-1338 (1988)
V. Warren Biricik
Appl. Opt. 28(8) 1501-1503 (1989)
Thomas K. Gaylord, E. N. Glytsis, and M. G. Moharam
Appl. Opt. 26(15) 3123-3135 (1987)