Abstract
No abstract available.
Full Article | PDF ArticleMore Like This
Holographic strain analysis: extension of fringe-vector method to include perspective
R. Pryputniewicz and Karl A. Stetson
Appl. Opt. 15(3) 725-728 (1976)
Holographic interferometry: identification of circuit board component failure
James R. Crawford and Robert Benson
Appl. Opt. 15(1) 24-25 (1976)
Holographic strain analysis by fringe-localization planes
Karl A. Stetson
J. Opt. Soc. Am. 66(6) 627-627 (1976)