Measuring Optical Scatter at Material Interfaces Using a Hemisphere

Robert F. Cartland

doi:10.1364/OIC.2010.ThD5

Optical Interference Coatings
OSA Technical Digest (Optica Publishing Group, 2010),
paper ThD5
•https://doi.org/10.1364/OIC.2010.ThD5

Measuring Optical Scatter at Material Interfaces Using a Hemisphere

Robert F. Cartland

Optical Interference Coatings 2010

Tucson, Arizona United States
6–11 June 2010
ISBN: 978-1-55752-891-9

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Measurement II (ThD)

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R. F. Cartland, "Measuring Optical Scatter at Material Interfaces Using a Hemisphere," in Optical Interference Coatings, OSA Technical Digest (Optica Publishing Group, 2010), paper ThD5.

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Abstract

Interfacial light scatter within a substrate was measured using a hemisphere. The hemisphere corrects the problem of refractive beam displacement allowing the bidirectional reflectance distribution function within the substrate to be determined.

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