Abstract
We demonstrate a multi-spectral imaging technique that utilizes integrated nanoantenna labels to enable rapid mapping of the type and location of every logical gate in an integrated circuit, and thereby detect hardware tampering.
© 2015 Optical Society of America
PDF Article | Presentation VideoMore Like This
A. Yurt, M. D. W. Grogan, M. S. Ünlü, and B. B. Goldberg
ATh1K.5 CLEO: Applications and Technology (CLEO:A&T) 2015
Thomas Van Vaerenbergh, Dave Kielpinski, Jason Pelc, Nikolas A. Tezak, Ranojoy Bose, Charles Santori, and Raymond G. Beausoleil
SM2G.8 CLEO: Science and Innovations (CLEO:S&I) 2016
Young-Kai Chen
FW3B.1 Frontiers in Optics (FiO) 2015