Abstract
The difficulty in characterising nonlinear integrated structures lies in assessing the real power injected into the guided mode. Nonlinear characterisations of nano-waveguides currently reported in literature rarely give a precise determination of the coupling efficiency, while it directly affects the nonlinear response. Using a single beam top-hat Dispersive-Scan (D-Scan) method, a temporal analogue of the top-hat Z-Scan [1], we show the first nonlinear waveguide characterisation that simultaneously and accurately measures the input (𝜅in) and output (𝜅out) coupling efficiencies, the effective Two-Photon Absorption (γTPA ) and Kerr (γ) nonlinear parameters. Like in Z-Scan, the D-Scan technique [2] advantageously gives access to the sign of the Kerr coefficient.
© 2017 IEEE
PDF ArticleMore Like This
Samuel Serna and Nicolas Dubreuil
LW2A.2 Latin America Optics and Photonics Conference (LAOP) 2016
S. Serna and N. Dubreuil
CD_5a_1 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2015
Samuel Serna, Hongtao Lin, Carlos Alonso-Ramos, Anupama Yadav, Xavier Le Roux, Kathleen Richardson, Eric Cassan, Nicolas Dubreuil, Juejun Hu, and Laurent Vivien
JW3A.72 Frontiers in Optics (FiO) 2017