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On-chip monitoring of far-field patterns using a planar diffractor in a silicon-based optical phased array

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Abstract

We demonstrate the on-chip monitoring of far-field patterns in a silicon-based optical phased array (OPA) using a planar diffractor and traveling-wave photodetectors (PDs) integrated at the end of the radiator array. To reproduce the diffraction patterns within a silicon slab, the planar diffractor is designed with a diffraction region surrounded by an absorptive boundary and seven discrete outlet waveguides. Each outlet waveguide is linked to the photon-assisted tunneling PD which has a silicon $p \text{-} n$ junction and is operated under a reverse bias to detect a sub-bandgap wavelength, 1.3 µm. With the ${1} \times {16}$ OPA and seven detectors, the positions of the main beams aligned to specific directions in the free space were clearly monitored.

© 2020 Optical Society of America

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