Abstract

An optical configuration is presented for simultaneous measurement of out-of-plane displacement and slope change in electronic speckle pattern interferometry. Experimental results for a rectangular plate clamped along the edges and loaded at the center are presented.

© 1993 Optical Society of America

Simultaneous displacement and slope measurement in electronic speckle pattern interferometry using adjustable aperture multiplexing

Min Lu, Shengjia Wang, Laura Aulbach, and Alexander W. Koch
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Simultaneous measurement of out-of-plane displacement and slope using a multiaperture DSPI system and fast Fourier transform

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Speckle interferometric methods of measuring small out-of-plane displacements

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Spatial phase shifting for pure in-plane displacement and displacement-derivative measurements in electronic speckle pattern interferometry (ESPI)

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Increased sensitivity to in-plane displacements in electronic speckle pattern interferometry

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