Abstract

Modeling of kinoforms in optical design software packages can be done in terms of the phase function ϕ(r). The required surface-relief profile t(r) is determined approximately from the relation t(r) = [λ/2π(μ − 1)][ϕ(r)]_2π, where λ is the operating wavelength, μ is the refractive index of the optical material of the surface relief, and [ϕ(r)]_2π is the phase function ϕ(r) modulo 2π. We present a semianalytical approach that enables one to determine the exact surface-relief profile from a given phase function. It is seen that there is a small but significant difference between the exact and the approximate surface-relief profiles. Some computational results are presented.

© 1995 Optical Society of America

Zone characteristics of planar kinoform lenses of any specific order for stigmatic imaging between extra-axial conjugate points

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J. Opt. Soc. Am. A 12(11) 2463-2470 (1995)

Generalized conversion from the phase function to the blazed surface-relief profile of diffractive optical elements

Michael A. Golub
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Extra-axial stigmatic imagery with a thick planar kinoform

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Curved kinoform lenses for stigmatic imaging of axial objects

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